- Braun, Wolfgang
Applied RHEED
- Reflection High-Energy Electron Diffraction During Crystal Growth
- Kartoniert,
- Softcover reprint of the original 1st ed. 1999,
- Springer, Berlin
- (2013)
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The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
MBE-grown semiconductor interfaces.- Reflection high-energy electron diffraction (RHEED).- RHEED osci ...
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DETAILS
- Applied RHEED
- Reflection High-Energy Electron Diffraction During Crystal Growth
- Braun, Wolfgang
- Kartoniert, ix, 220 S.
- IX, 220 p. 180 illus., 11 illus. in color.
- Sprache: Englisch
- 235 mm
- ISBN-13: 978-3-662-15614-8
- Titelnr.: 43714315
- Gewicht: 367 g
- Springer, Berlin (2013)
Herstelleradresse
Springer Heidelberg
Tiergartenstr. 17
69121 - DE Heidelberg
E-Mail: buchhandel-buch@springer.com
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